ML-SIM: A deep neural network for reconstruction of structured illumination microscopy images

Structured illumination microscopy (SIM) has become an important technique for optical super-resolution imaging because it allows a doubling of image resolution at speeds compatible for live-cell imaging. However, the reconstruction of SIM images is often slow and prone to artefacts. Here we propose a versatile reconstruction method, ML-SIM, which makes use of machine learning. The model is an end-to-end deep residual neural network that is trained on a simulated data set to be free of common SIM artefacts. ML-SIM is thus robust to noise and irregularities in the illumination patterns of the raw SIM input frames. The reconstruction method is widely applicable and does not require the acquisition of experimental training data. Since the training data are generated from simulations of the SIM process on images from generic libraries the method can be efficiently adapted to specific experimental SIM implementations.


There's unfortunately not much to read here yet...

Discover the Best of Machine Learning.

Ever having issues keeping up with everything that's going on in Machine Learning? That's where we help. We're sending out a weekly digest, highlighting the Best of Machine Learning.

Join over 900 Machine Learning Engineers receiving our weekly digest.

Best of Machine LearningBest of Machine Learning

Discover the best guides, books, papers and news in Machine Learning, once per week.